中科院半導體所何亞偉報告簡介：基于深層瞬態(tài)光譜學的Al/Ti 4H-SiC肖特基結(jié)構(gòu)缺陷研究 Investigation of Defect Levels of Al/Ti 4H-SiC Schottky Structures byDeep Level Transient Spectroscopy何亞偉 中國科學院半導體研究所 HE Yawei Institute of Semiconductors, Chinese Academy of Sciences
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